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National Repository of Grey Literature 2 records found  Search took 0.00 seconds. 
Electro-thermal model and simulation of integrated circuit
 Sikora, Martin ; Kledrowetz, Vilém (referee) ; Prokop, Roman (advisor)
Thermal effects in integrated circuits have increasing impact on chip's lifetime and function. For this reason, the chips must be subjected to electro-thermal simulations prior to the launch of production in order to avoid potential circuit failures. Therefore, in the first part of this diploma thesis these effects and methods of creating thermal models are described. The thesis also explores available tools for electro-thermal simulations and the way these simulators work. In the practical part of the thesis, the operation of electro-thermal simulation in the Eldo tool is verified, a method of automated thermal network creation is proposed and a application for its generation based on the circuit layout is implemented. The results of the electro-thermal simulation with the generated thermal network are compared with the results of the currently used method.
Detailed record
Electro-thermal model and simulation of integrated circuit
 Sikora, Martin ; Kledrowetz, Vilém (referee) ; Prokop, Roman (advisor)
Thermal effects in integrated circuits have increasing impact on chip's lifetime and function. For this reason, the chips must be subjected to electro-thermal simulations prior to the launch of production in order to avoid potential circuit failures. Therefore, in the first part of this diploma thesis these effects and methods of creating thermal models are described. The thesis also explores available tools for electro-thermal simulations and the way these simulators work. In the practical part of the thesis, the operation of electro-thermal simulation in the Eldo tool is verified, a method of automated thermal network creation is proposed and a application for its generation based on the circuit layout is implemented. The results of the electro-thermal simulation with the generated thermal network are compared with the results of the currently used method.
Detailed record

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